News About Test Equipment & Microprobe Stations

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The J microTechnology Website changes over time! Check back here periodically to find product and service updates, and other information hot off the presses. 

Press Releases

• LMS-45 Precise Z-Lift Chuck

Release        Photo     Data sheet

• NAT-31 42X-540X Microscope Inspection System

Release        Photo     Data sheet

• LMS-91A Temperature Controlled Chuck

Release        Photo     Data sheet

• NAT-30 USB Camera

Release        Photo     Data sheet

• LMS-2709 Laboratory Microprobe Station

Release        Photo     Data sheet



Announcements

• Digital Camera Adapter Kit
J microTechnology offers an adapter kit for mounting many digital cameras to the NAT-27 microscope. In particular, is an adapter for the popular Nikon 950/990 series. This offers a cost effect way to document test samples and probing setups. Contact J microTechnology for details.

QUALITY PICTURES AT AN AFFORDABLE PRICE

• Larger Travel/Larger Chuck Probe Stations
J microTechnology is bring to market two new probe stations to serve the needs of the engineering development and test project teams. The Jr-2745 offer 6" by  7" X and Y translation of the test device with 6.5" and 8.5" chucks. Chuck now slides out for easy load/unload of wafers and test devices. Overall size is 14" by 20" by less than 7" high. Contact J microTechnology for details.

COMPACT SIZE, VALUE ORIENTED

Ads

• LMS-2709 Lab Microprobe Station

Ad        Data sheet

• JR-2727 Personal Probe Station

Ad        Data sheet

• Jr-2745 Manual Probe Station

Ad        Data sheet

• PP™ CPW to Microstrip Adapter Substrates

Ad        Data sheets 5 mil 10 mil 15 mil

• Productivity Ad

Ad       




• Thermal Chuck Adapter Kit
A new product for J microTechnology is the Thermal Chuck 
Adapter Kit  LMS-16. This kit allows mechanical compatibility with both TrioTech and MicroManipulator Thermal Chucks. Home brew thermal chucks can also be easily adapted to the industry standard mounting pattern. 

WHY PAY MORE FOR A PROBE STATION TO OCCASSIONALLY PROBE OVER TEMPERATURE! Wafer Probe Station RF ProbeStationManual Probe Station