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About		 Products include Probe Stations, Test Fixtures, ProbePoint(tm) thin film adapter substrates, calibration standards substrates, high performance test cables and other accessories. 
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ProbePoint Adapter Substrates
and other
Thin Film Networks (TFNs)
Data Sheets

       

Offers Low power for Probe Placement and High Power for device inspection  Flexible documention of test device set up

NAT-31 21X-540X Microscope         NAT-30 USB Camera

Probe Stations

Product Selection Guide  Feature Comparison

Lab Microprobe Station Low cost RF Microwave Probe Station low current DC measurements cox triax probes shielded guarded chuck MEMS nanotechnology sensors american probe technologies

Laboratory (RF)Microprobe Station
LMS-2709
Laboratory (DC)Microprobe Station
(Coax/Triax probes, guarded chuck)
 

Precision microwave and RF test. General purpose compatible with thermal chucks and temperature controlled chucks Useful for MEMS Nanoelectronics package characterization analytical measurements
 Personal Probe Stations and Test Fixtures
  JR-2727
 
 
 
 

General purpose manual probe station for the test and evaluation of semiconductor wafers up to 8 inches or 200 mm Probe Card holder option A low cost test station for probe card checktest program out DiVA 225 compatible
 

Manual Probe Stations 
 JR-2745
6.5" std chuck or  8.5" std chuck 

JR-2745 Manual Probe Station is a
low cost manual probe station for testing 
high speed, microwave and RF semiconductors 
with wafer sizes up to 200mm (8") 
magnetic mount or 'bolt on' microwave positioners 
Up to 7 Microwave Positioners can be mounted 
SW, W, NW, N, NE, E, and SE simultaneously 
Top Plate Insert for true N,S,E,W probe placement 
4.5" probe card adapter available

  Microscope  
             The NAT-27T Trinocular Stereo Zoom microscope is compatible with the JR-2727 and JR2745. This microscope includes a swing arm stand for full coverage of the probing area of a the Jr-2727, JR-2736 and JR-2745. A video adapter, 10X and 25X Wide Field eyepieces are standard. Other features are described in the datasheet. Binocular version available for cost sensitive test environments.
NAT-27

 
RF and DC Probe Positioner with 0.5" of X Y Z travel      PRecision X Y Z Translation stage for Microwave Probe control with Cross Roller barings and Probe Planarity adjustment
KRN-09                                                    KRN-18
Probe Positioners  
             KRN- positioners are application oriented probes positioners and are available for the Jr-2700, JR-2727 and JR-2745. A selection guide describing the various in models and features can be downloaded below.
KRN-Datasheet

 
 

Probe Card Adapter Kit fo Manual Probe Station. Useful for Probe Card and Test Program Evaluation at a fraction of the equipment cost of shared time on production probe stations

Probe Card Adapter Kit  
LMS-18 Probe Card Adapter Kit is compatible with industry standard 4.5 inch probe cards. This can be used for  fixtures to test DC through microwave DUTs, thin film or MMIC.
A J microTechnology probe station with a probe card adapter is a low cost test station to perform engineering check out of production probe cards and production test programs.
The probe card adapter can be used on all probe stations, JR-2727 Personal Probe Station and JRr-2745 Manual Probe Stations. 
 
A LOW COST ALTERNATIVE FOR B/B and PILOT PRODUCTION TEST and TEST DEVELOPMENT ENGINEERING!

 
 

LMS-90A
Thermal Chuck

Low cost temperature control system for J microTechnology manual probe stations and for bench top test. System is compatible with JR- series probe station, and standard or custom chucks. Temperature range is -5°C to +125°C. Vacuum DUT hold down. Worldwide universal power supply.

 
 

Temperature Controlled Chuck adds flexibility to semiconductor device characterization flexibility

LMS-91A
Thermal Chuck

Low cost temperature control system for J microTechnology Laboratory Microprobe Stations. System is compatible with LMS-2709 probe station, and standard or custom chucks. Temperature range is -5°C to +135°C. Vacuum DUT hold down. Worldwide universal power supply.


  
PCB Holder/Chuck
High frequency characterization of Surface Mount Components and engineering test of RF/Wireless subassemblies is usually on double sided PCB substrates. The LMS-10 PCB Holder/Chuck allows for 0.5" to 2.25" wide by up to 5" long and .030" to .1" thick PCBs to be held in place for precision probing. There is 0.15" min. clearance underneath the PCB. Can be used on both JR-2700 Test Fixture and JR-2727 Personal Probe Station. 

AN INEXPENSIVE TEST SETUP FOR MEASUREMENT BASED MODELS!

 
 
 

CPW to Microstrip adapter substrates
 
 

Adapter Substrates for the precision test of microstrip components 

ProbePoint Adapter Substrates

 Introduction to Adapter Substrates

ProbePoint Adapters Substrates are used to create test fixtures that coplanar or coaxial microprobes, either Picoprobes from GGB Industries or ACP/FPC probes from Cascade Microtech, Inc (CMI), can be used to precisely make electrical measurements. Because of the precision and repeatibility of the adapter substrates and the availability of calibration substrates for direct calibration of the adapters, metrology grade measurements can be made to 60 GHz and above. This makes these adapter substrates a useful tool for engineers and scientist who characterize various microstrip and surface mount devices(SMD) for "wireless" and microwave circuit design and analysis. 

ProbePoint Adapter Substrates are thin film ceramic components available in three different thickness, 5 mil 10 mil and 15 mil. An overview of the products is contained in the Introduction to Adapter Substrates. 

ProbePoint Microstrip Transmission Line Substrates are used for package characterization and interconnection of multichip MMIC devices. Standard and custom lengths up to .5" are available in either 5 or 10 mil thickness alumina. 0.1", 0.18", 0.25", 0.5" are available from stock. Custom lengths are three week delivery. 

Both standard and custom Calibration Standards available for SAW SMD packages. Replacement calibration substrates available for the repair of selected ICM fixtures. 

Data Sheets 5 mil    Data Sheets 10 mil    Data Sheets 15 mil
 

Data Sheet Carriers
 

MicroStrip Lines

Microstrip Lines on 5 mil and 10 mil Alumina are available from J microTechnology, Inc. These lines are useful for chip to chip interconnection in both test circuits and small run production RF/microwave modules. 

Standard and custom Lengths are available from 50 mils to 500 mils.

Contact us for details. 

Test Cables

The highest quality test cables, competively priced - in stock. 


Constructed for 40 GHz, tested to 20 GHz, cables also available!

PP20-1          PP20-2.5    PP20-2.5
40 GHz-12"    40 GHz-30"   40 GHz-48"
















 

                    J microTechnology - 3744 NW Bluegrass Pl. - Portland - OR - 97229
                                                                                     (503) 614-9509 (V) - (503) 531-9325 (F)